Answer Posted / navya

IDDQ testing:usually performed at the beginning of test cycle.The test checks for leakage current to know if it is in normal range or abnormal range.If abnormal die fails,it is rejected and no further tests are performed.Iddq testing can detect clusters of gate oxide shorts(GOS) where gate voltage has no control over drain current and they tend to increase leakage levels.


BIST(built in self test): used to meet requirements such as high reliability and low repair cycle times.Bist reduces need for external testing(ATE).But the disadvantage is additional silicon area needed to implement BIST circuitry.

Scan design:test methodology built into digital chips
All flipflop are provided with alternate i/p for data as well as a separate clk i/p for scan testing.F/f connected together in scan chains.Testing is done by entering a special test mode called "scan mode" where test vectors is i/p to each scan chain and the bits clkd through all f/f's in the chain with resulting o/p chkd for errors.

Stuck at fault models:
stuck-on fault:always conducts Ids with an applied Vds,gate has no control over the operation
stuck off faults:current never flows regardless of Vgs or Vds.

Explain Basic Stuff related to Perl?

1096

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If not into production, how far did you follow the design and why did not you see it into production?

2148

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Insights of a 4bit adder/Sub Circuit?

3417

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Describe a finite state machine that will detect three consecutive coin tosses (of one coin) that results in heads.

2887

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What are the Advantages and disadvantages of Mealy and Moore?

1344

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Implement a function with both ratioed and domino logic and merits and demerits of each logic?

3847

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How does a Bandgap Voltage reference work?

3970

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What are the different design techniques required to create a layout for digital circuits?

1093

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what is the use of defpararm?

1194

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In a SRAM layout, which metal layers would you prefer for Word Lines and Bit Lines? Why?

4171

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what is verilog?

1199

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Need to convert this VHDL code into VLSI verilog code? LIBRARY IEEE; USE IEEE.STD_LOGIC_1164.ALL; ----using all functions of specific package--- ENTITY tollbooth2 IS PORT (Clock,car_s,RE : IN STD_LOGIC; coin_s : IN STD_LOGIC_VECTOR(1 DOWNTO 0); r_light,g_light,alarm : OUT STD_LOGIC); END tollbooth2; ARCHITECTURE Behav OF tollbooth2 IS TYPE state_type IS (NO_CAR,GOTZERO,GOTFIV,GOTTEN,GOTFIF,GOTTWEN,CAR_PAID,CHEATE D); ------GOTZERO = PAID $0.00--------- ------GOTFIV = PAID $0.05---------- ------GOTTEN = PAID $0.10---------- ------GOTFIF = PAID $0.15---------- ------GOTTWEN = PAID $0.20--------- SIGNAL present_state,next_state : state_type; BEGIN -----Next state is identified using present state,car & coin sensors------ PROCESS(present_state,car_s,coin_s) BEGIN CASE present_state IS WHEN NO_CAR => IF (car_s = '1') THEN next_state <= GOTZERO; ELSE next_state <= NO_CAR; END IF; WHEN GOTZERO => IF (car_s ='0') THEN next_state <= CHEATED; ELSIF (coin_s = "00") THEN next_state <= GOTZERO; ELSIF (coin_s = "01") THEN next_state <= GOTFIV; ELSIF (coin_s ="10") THEN next_state <= GOTTEN; END IF; WHEN GOTFIV=> IF (car_s ='0') THEN next_state <= CHEATED; ELSIF (coin_s = "00") THEN next_state <= GOTFIV; ELSIF (coin_s = "01") THEN next_state <= GOTTEN; ELSIF (coin_s <= "10") THEN next_state <= GOTFIV; END IF; WHEN GOTTEN => IF (car_s ='0') THEN next_state <= CHEATED; ELSIF (coin_s ="00") THEN next_state <= GOTTEN; ELSIF (coin_s="01") THEN next_state <= GOTFIV; ELSIF (coin_s="10") THEN next_state <= GOTTWEN; END IF; WHEN GOTFIF => IF (car_s ='0') THEN next_state <= CHEATED; ELSIF (coin_s = "00") THEN next_state <= GOTFIF; ELSIF (coin_s ="01") THEN next_state <= GOTTWEN; ELSIF (coin_s = "10") THEN next_state <= GOTTWEN; END IF; WHEN GOTTWEN => next_state <= CAR_PAID; WHEN CAR_PAID => IF (car_s = '0') THEN next_state <= NO_CAR; ELSE next_state<= CAR_PAID; END IF; WHEN CHEATED => IF (car_s = '1') THEN next_state <= GOTZERO; ELSE next_state <= CHEATED; END IF; END CASE; END PROCESS;-----End of Process 1 -------PROCESS 2 for STATE REGISTER CLOCKING-------- PROCESS(Clock,RE) BEGIN IF RE = '1' THEN present_state <= GOTZERO; ----When the clock changes from low to high,the state of the system ----stored in next_state becomes the present state----- ELSIF Clock'EVENT AND Clock ='1' THEN present_state <= next_state; END IF; END PROCESS;-----End of Process 2------- --------------------------------------------------------- -----Conditional signal assignment statements---------- r_light <= '0' WHEN present_state = CAR_PAID ELSE '1'; g_light <= '1' WHEN present_state = CAR_PAID ELSE '0'; alarm <= '1' WHEN present_state = CHEATED ELSE '0'; END Behav;

5328

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How can you model a SRAM at RTL Level?

5782

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What was your role in the silicon evaluation or product ramp? What tools did you use?

2382

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Implement a 2 I/P and gate using Tran gates?

4062

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