Explain about stuck at fault models, scan design, BIST and
IDDQ testing?
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Answer Posted / shashank parashar
BIST is a biult in self test,in which we are going to test
our circuit in chip only.
Dft is a design for test.
IDDQ testing is used for testing the library cells.
| Is This Answer Correct ? | 3 Yes | 9 No |
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